ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,667, issued on April 21, was assigned to Tektronix Inc. (Beaverton, Ore.). "System and method for detection of anomalies in test and measu... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,668, issued on April 21, was assigned to Lockheed Martin Corp. (Bethesda, Md.). "Systems and methods for wireless test modules of a wirele... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,669, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor chip and semiconductor packa... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,670, issued on April 21, was assigned to CHROMA ATE INC. (Taoyuan City, Taiwan). "Method and apparatus for testing a package-on-package se... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,671, issued on April 21, was assigned to MediaTek Inc. (Hsinchu City, Taiwan). "RF testing method and testing system" was invented by Jung... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,672, issued on April 21, was assigned to QUALCOMM Inc. (San Diego). "Apparatus and methods for voltage droop detection in die architecture... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,673, issued on April 21, was assigned to QUALCOMM Inc. (San Diego). "Modular scan data network for high speed scan data transfer" was inve... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,674, issued on April 21, was assigned to JST POWER EQUIPMENT INC. (Lake Mary, Fla.). "Switchgear ground and test device having ground shoe... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,675, issued on April 21, was assigned to ABB Schweiz AG (Baden, Switzerland). "Circuit breaker state detector, and low-voltage electrical ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,676, issued on April 21, was assigned to Allegro MicroSystems LLC (Manchester, N.H.). "Open-circuit sensors utilizing inductive coupling" ... Read More